Up for sale is a lot of three genuine Sloan Dektak Step Height Calibration Standards, each marked 10KA / 10,000 Angstroms ±1%, housed in their original wooden storage cases.

These are specialized semiconductor metrology standards used with Sloan / Veeco Dektak stylus profilometers for step-height verification and calibration. Instruments in the Dektak family are used in thin-film, microfabrication, and semiconductor environments for measuring step height, film thickness, and related surface features.

Provenance:
These came from a former Motorola MOS-15 technician and metrology engineer who worked directly in the calibration of fab-related instruments and led teams responsible for maintaining calibration processes on-site. That makes this lot more than generic surplus — it is a real piece of legacy semiconductor metrology history tied to Motorola’s chip-manufacturing era.

Each standard is marked:

10KA = 10,000 Å ±1%
(approximately 1.0 micron ±1%)

These may appeal to several buyer groups:
• Legacy semiconductor / wafer-fab users
• Universities and teaching labs
• Microfabrication / cleanroom facilities
• Collectors of semiconductor or computing history
• Museums or technology archives

All three are sold as pictured. Wooden cases show normal cosmetic wear from age and lab storage. Because this is specialized technical equipment, buyers should confirm suitability for their use, collection, or archival needs.