Third Edition, 2003
This text provides students as well as practitioners with a
comprehensive introduction to the field of scanning electron
microscopy (SEM) and X-ray microanalysis. The authors
emphasize the practical aspects of the techniques described.
Topics discussed include user-controlled functions of scanning
electron microscopes and x-ray spectrometers and the use of
x-rays for qualitative and quantitative analysis. Separate
chapters cover SEM sample preparation methods for hard
materials, polymers, and biological specimens. In addition
techniques for the elimination of charging in non-conducting
specimens are detailed.
internal code: A005305
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