Weitere details

Titel: Quantitative Atomic-Resolution Electron Microscopy
Zustand: Neu
Description: Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
Autor: Martin Hÿtch
EAN: 9780128246078
Contributor: Martin Hÿtch (Series edited by), Peter W. Hawkes (Series edited by)
ISBN: 9780128246078
Produktart: Gebundene Ausgabe
Erscheinungsdatum: 07.04.2021
Herstellungsland und -region: US
Höhe: 229mm
Länge: 152mm
Genre: Technology & Engineering
Buchreihe: Advances in Imaging and Electron Physics
Verlag: Academic Press Inc
Sprache: Englisch
Gewicht: 610g
Thematik: Computing & Internet

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