Key Features

y One, two or four individual outputs

y Single Mode variant

y Compatible with all MAP-300 series and MAP-220

Applications

y 1310nm/ 1550nm source enables R&D tests in Silicon-Photonic applications

y Channel monitoring in DWDM systems y DFB sources for system telemetry

channels

y Loss and power meter calibration

y Enabling 400GE manufacturing test.

y Spectroscopy, metrology and atomic physics

y Wavelength grid matched to LANWDM channels with power adjustment of at least 10dB

Price not included VAT, customer inside CE or members of CE without CE VAT number valid, must to add 21% VAT.