-Key Features • Complete polarization control
• Designed to meet IEEE Std. 802.3aeTM 10 GbE testing
requirements
• Designed to perform fast polarization dependent loss
(PDL) measurements (4-state Mueller method)
• Compact single width cassette
• Very high angular accuracy and absolute fast axis
alignment accuracy
• Can be automated when used with MAP-200
LXI™-compliant interfaces and IVI drivers
-The Multiple Application Platform (MAP) Polarization Controller (mPCS-A1) is
optimized for the industry-leading JDSU MAP-200 platform. Based on the
previous-generation Multiple Application Platform (MAP), the MAP-200 is the
first photonic layer lab and manufacturing platform that is LAN Extensions for
Instrumentation (LXI)-compliant by conforming to the required physical
attributes, Ethernet connectivity, and interchangeable virtual instrument (IVI)
drivers. The MAP-200 platform is optimized for density and maximum configurability
to meet specific application requirements in the smallest possible footprint.
The mPCS-A1 provides an efficient and precise way of creating any state of
polarization. It can also be used as part of a polarization state analyzer. The
mPCS-A1 is comprised of three rotating elements: a high extinction ratio
polarizer, a quarter-wave plate and a half-wave plate. The controller configuration
can be offered with a single-mode (SM) or a polarization maintaining fiber
(PMF) input.
The polarization controllers can be combined with other instruments to complete
measurement test systems such as erbium-doped fiber amplifier (EDFA) or
passive component test sets.
-Applications
• Passive component PDL and
polarization mode dispersion
(PMD) measurements
• EDFA noise and polarization
dependent gain (PDG) measurements
• 10 GbE transceiver worst-case
relative intensity noise and
dispersion penalty measurements
• Optical signal-to-noise ratio
(OSNR) and extinction ratio (ER)
measurements
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