Key Benefits

y Complete C and L band characterization of high-port-count devices in less than 5 seconds

at maximum dynamic range

with unprecedented wavelength resolution

y Patented parallel test architecture dramatically increases manufacturing output at a fraction of your initial investment

y Lets you compete in Next-Gen CDC device manufacturing

y Cuts floor-space requirements in half compared to previous SWS generations

y Maximize production up-time with local service options

Applications

Perform optical component and module characterization using these devices in both

R&D and manufacturing environments:

y ROADMs, wavelength-selective switches, wavelength blockers

y Optical circuit packs

y Dense-wavelength-division

multiplexers (DWDM)

y Tunable filters, couplers, splitters, switches, attenuators, interleavers

y Microelectromechanical systems (MEMs) and waveguide devices

PRODUCT ID 1085-1084-83-82

Price not included VAT, customer inside CE or members of CE without CE VAT number valid, must to add 21% VAT.