=== START OF INFORMATION SECTION === Model Number: CT4000P3SSD8 Serial Number: 2349E887A6D1 Firmware Version: P9CR30A PCI Vendor/Subsystem ID: 0xc0a9 IEEE OUI Identifier: 0x00a075 Controller ID: 1 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 4,000,787,030,016 [4.00 TB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 6479a7 877000000f Local Time is: Tue Sep 15 09:49:05 2026 UTC Firmware Updates (0x12): 1 Slot, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005e): Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x06): Cmd_Eff_Lg Ext_Get_Lg Maximum Data Transfer Size: 64 Pages Warning Comp. Temp. Threshold: 85 Celsius Critical Comp. Temp. Threshold: 95 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 6.00W 0.0000W - 0 0 0 0 0 0 1 + 3.00W 0.0000W - 0 0 0 0 0 0 2 + 1.50W 0.0000W - 0 0 0 0 0 0 3 - 0.0250W 0.0000W - 3 3 3 3 5000 1900 4 - 0.0030W - - 4 4 4 4 13000 100000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 1 1 - 4096 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02, NSID 0xffffffff) Critical Warning: 0x00 Temperature: 33 Celsius Available Spare: 100% Available Spare Threshold: 5% Percentage Used: 25% Data Units Read: 591,365,819 [302 TB] Data Units Written: 554,708,411 [284 TB] Host Read Commands: 1,587,982,017 Host Write Commands: 1,229,862,586 Controller Busy Time: 22,069 Power Cycles: 3,300 Power On Hours: 9,599 Unsafe Shutdowns: 1,829 Media and Data Integrity Errors: 0 Error Information Log Entries: 7,963 Warning Comp. Temperature Time: 250 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 33 Celsius Temperature Sensor 2: 33 Celsius Temperature Sensor 8: 33 Celsius Thermal Temp. 1 Transition Count: 68 Thermal Temp. 2 Transition Count: 22 Thermal Temp. 1 Total Time: 87814 Thermal Temp. 2 Total Time: 45624 Error Information (NVMe Log 0x01, 16 of 16 entries) Num ErrCount SQId CmdId Status PELoc LBA NSID VS Message 0 7963 0 0x6010 0x4005 0x028 0 0 - Invalid Field in Command Self-test Log (NVMe Log 0x06, NSID 0xffffffff) Self-test status: No self-test in progress No Self-tests Logged
Description:
This memory module is in Used Good condition. It exhibits light signs of previous use but is physically intact and fully fit for its intended use.
PCB/Circuit Board: No cracks, chips, or delamination. The substrate is straight and shows no signs of overheating or "blistering."
Gold Contacts (Fingers): The connection points are clean and intact. There may be minor insertion marks from previous use, but there is no scoring, deep scratches, or oxidation.
Components: All surface-mount components (capacitors, resistors, and IC chips) are present and securely attached.
Labels: The manufacturer’s label is fully intact and legible, clearly displaying the Part Number, Capacity, Speed (MHz), and Timings (CL).
Heat Spreader (if applicable): If equipped with a factory heat sink, it may show minor surface scuffs but is not bent or detached from the chips.
Note: This is a "pull" from a professional working environment. Any cosmetic wear is strictly superficial and does not impact the module’s stability or heat dissipation.
Description: This RAM module has been tested for Key Functions and is confirmed to be in good working condition for its primary purpose: high-speed volatile data storage.
Recognition: The module is correctly identified by the BIOS/UEFI at its rated speed and capacity.
Memory Testing: The module has passed a diagnostic test (such as MemTest86 or equivalent) with zero errors detected.
Stability: The module maintained consistent performance under standard operating voltages without crashing or triggering system reboots.