YUSHI Dynamic Leeb Hardness Tester Probe G Type Impact Device NDT Testing
Purchasing Details
The G Probe is used on heavy, rough, cast and forged work pieces.
Listing  including：An G impact device/A connection cable /A supporting ring/A brush
 
Model G Type
Impact Energy 90N/mm
Diameter of Spherical Tip 5mm
Diameter of Impact Device 30mm
Length of Impact Device 246mm
Max Hardness of Sample 650HB
Min. Thickness of Sample 10mm
Min. Thickness of Layers 1.2mm
 
We support payment methods such as PayPal, credit card, Google Pay/Apple Pay, etc. The specific payment methods are subject to the actual page display.
We support Fedex, DHL, UPS and EMS.
Import duties and taxes are not included in item price or shipping charges.These charges are buyer's responsibility.
We accept returns within 30-60 days.
We encourage all customers to communicate with us through eBay messages. If you have any questions or comments whatsoever regarding our products or listing, we are waiting to hear from you.
One year warranty is offered for our instruments(NOT INCLUDING PARTS). If the instruments malfunctioned under proper usage per instructions manual within the warranty period, please contact us to obtain shipping instructions and send it back .
3-7 business days evaluation and investigation take place after receiving your return item. A brand new replacement unit will be sent to you at our shipping costs if it meets our warranty requirements. 
YUSHI INSTRUMENTS，formerly the Shenyang Flaw Detector Factory, originated in 1985. As one of the professional manufactures and suppliers of NDT products in China, we own the independent intellectual property rights and honorably have the national patents for new products. we have a strong R&D team for technical support and extending new products year by year, Now they have been exported to many countries of the world and won good reputation from our domestic and foreign customers. we aim to provide our customers with reliable quality, high performance products, fast delivery, satisfactory service and competitive price. Sincerely looking forward to earlier and long cooperation with you.
If you have any other questions, please contact our eBay customer service , we will reply within 24 hours.
Other Instruments
Country of OriginChina
BrandYUSHI
Gage TypeHardness Tester Probe
TypeHardness
ModelG type
MPNP-301-0004
California Prop 65 WarningNO
Unit Quantity1
Unit TypeUnit
PushAuction